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ETALON Series
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High Accuracy Contact AFM probes with 2 cantilevers. Force constant 0.65 and 0.26 N/mPart Number: HA_C
Force constant (probe 2) min, N/m - 0.2
Force constant (probe 2) typical, N/m - 0.26
Force constant typical, N/m - 0.65
Material - Polysilicon lever, monocrystal silicon tip
Resonant frequency (probe 2) min, kHz - 16
Resonant frequency (probe 2) typical, KHz - 19
Resonant frequency typical, KHz - 37
Tip Coating - No
Tip curvature radius, nm - <10nm. Tip shape: octahedral at the base, conic with angle 30 degrees on last 200nm.
As low as £248.00 -
High Accuracy Contact/SemiContact AFM probes with 2 cantilevers. Force constant 1.0 and 1.5 N/m and resonant frequency 46 and 66 kHzPart Number: HA_CNC
Force constant (probe 2) min, N/m - 1.2
Force constant (probe 2) typical, N/m - 1.5
Force constant typical, N/m - 1
Material - Polysilicon lever, monocrystal silicon tip
Resonant frequency (probe 2) min, kHz - 59
Resonant frequency (probe 2) typical, KHz - 66
Resonant frequency typical, KHz - 46
Tip Coating - No
Tip curvature radius, nm - <10nm. Tip shape: octahedral at the base, conic with angle 30 degrees on last 200nm.
As low as £248.00
