NT-MDT AFM-Raman systems, TERS Systems, SPM, AFM

NT-MDT AFM systems, AFM-Raman systems, TERS Systems, SPM

NT-MDT Spectrum Instruments

Over the last 28 years, NT-MDT has been involved in the development, production and support of research instrumentation, primarily, atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. Our pathway has been marked by the creation of a large number of devices, whose functions and capabilities cover the broad range of customer needs in different areas: university education, academic and industrial research. NT-MDT pioneering efforts led to the impressive combination of scanning probe microscopy with Raman spectroscopy.
NT-MDT Spectrum Instruments is the result of the reorganization of NT-MDT corporate structure to maintain its lead in AFM and AFM – nano-Raman/IR. In the new form, NT-MDT’s businesses are represented by companies in Russia, Europe, USA and China.

silicon-cantilever_02calibration-gratings_02

scanwelprobes

Click here for our range of NT-MDT cantilevers and calibration samples!
You will be redirected to our dedicated website www.scanwelprobes.co.uk

NT-MDT product line

VEGA AFM System

VEGA AFM System

A cutting edge instrument designed for automated study of sample arrays. Up to 200×200 mm and 40 mm in height samples can be imaged at any point with 1 µm positioning accuracy. With built-in acoustic and vibration isolation, active temperature stabilisation, industry lowest 25 fm/√Hz optical beam deflection sensor noise and unique design of tip-scanning system, this AFM is designed for routine high resolution imaging.

 
NEXT II

NEXT II

Atomic Force Microscope NEXT provides motorized sample positioning and integrated high resolution optical microscope positioning, motorized continuous zoom and focusing of the optical microscope. But AFM automation is more than just motorization. Powerful Nova PX software algorithms remove a gap between optics and AFM providing continuous zoom from huge panoramic optical view down to atomic resolution.
Since all step movers are coupled together with the optical image, NEXT provides autofocus, fast one-click cantilever alignment, panoramic optical view and multiple scanning on 5×5 mm range.

 
AFM-Raman Systems (NTEGRA Spectra II)

AFM-Raman Systems (NTEGRA Spectra II)

Simultaneously measured AFM and Raman maps of exactly the same sample area provide complementary information about sample physical properties (AFM) and chemical composition (Raman). NTEGRA Spectra II with the help of Tip Enhanced Raman Scattering (TERS) enables the system to perform spectroscopy/microscopy with nanometre scale resolution. Specially prepared AFM probes (nanoantennas) can be used for TERS to enhance and localize light at the nanometer scale area near the tip apex. More than 30 basic and advanced AFM modes including HybriD ModeTM are supported providing extensive information about the sample surface physical properties. Integration of AFM with confocal Raman/fluorescence microscopy provide the widest range of additional information about the sample.

AFM-IR Systems (NTEGRA Nano IR)

AFM-IR Systems (NTEGRA Nano IR)

Ultralow drift IR s-SNOM microscopy and spectroscopy with 10 nm spatial resolution

NT-MDT Spectrum Instruments presents NTEGRA Nano IR – scattering scanning near-field optical microscope (s-SNOM) designed for infrared (IR) spectral range. AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis. Far-field component of the collected signal is suppressed by using lock-in techniques at cantilever oscillation frequencies. NTEGRA Nano IR system allows detection of near-field signal amplitude and phase. Spatial resolution of IR s-SNOM is about 10 nm and defined only by tip size.

 

NTEGRA AFM System

NTEGRA AFM System

The NTEGRA AFM platform is the most customisable AFM in the NT-MDT range. The device is capable of performing more than 40 measuring modes, enabling the analysis of surface physical and chemical properties with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment (gas, humidity, high-vacuum, controlled temperature). Accessories include magnetic field generators, a wide range of liquid and electrochemical cells. The new generation electronics provides operation at high-frequency (up to 5MHz) modes, enabling the use of high-frequency AFM modes and cantilevers.

Since all step movers are coupled together with the optical image, NEXT provides autofocus, fast one-click cantilever alignment, panoramic optical view and multiple scanning on 5×5 mm range

Solver Nano

Solver Nano

The Solver Nano is a compact AFM system designed to give a good range of features for a competitive price. Designed by the NT-MDT team that also created high performance, field-proven systems like Ntegra, NEXT and Spectra, the system
is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors and is capable of a wide range of imaging modes.