IONTOF TOF-SIMS, LEIS, SIMs Instruments, Surface Analysis, MFM

IONTOF TOF-SIMS, LEIS, SIMS Instruments, Surface Analysis, MFM


IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS). Founded as a classical spin-off of the University of Münster, IONTOF has meanwhile become the technological leader in the field of TOF-SIMS and LEIS instrumentation. The company was founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr. Thomas Heller in 1989 to commercialise the original research carried out by Prof. Benninghoven and his team at the University of Münster in Germany from the early 80’s.

Since the technique became commercially viable, IONTOF has made many product improvements and more than 280 instruments are in operation in industrial and academic laboratories worldwide. Today, the IONTOF group consists of four different companies. The ION-TOF Gesellschaft für Herstellung von Massenspektrometern GmbH, short form ION-TOF GmbH, which sells, produces and services all IONTOF analytical instruments. The ION-TOF Technologies GmbH which is in charge of all R&D projects. The subsidiary IONTOF USA which was founded for sales and after sales service in the United States and the Swiss-based Nanoscan AG for all R&D projects in the field of SFM technology.

IONTOF product line

TOF.SIMS 5: Superior Performance for all SIMS Applications

The TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed over the last 25 years. Its design guarantees optimum performance in all fields of SIMS applications. The flexible, high precision sample manipulator as well as the perfect charge compensation allow the analysis of virtually all kinds of samples, making the TOF.SIMS 5 the most flexible SIMS tool in the market.

SIMS / SPM Combination: 3D SIMS Imaging

Information concerning chemical composition, physical properties and the three-dimensional structure of materials and devices at the nanometer scale is of major importance for new developments in nanoscience and nanotechnology. In a 3D SIMS measurement the initial topography of the sample surface as well as topographic changes during the experiment cannot be easily identified. Scanning Probe Microscopy (SPM) provides complementary information about the surface topography and can also be used to measure the physical properties of the analysed sample.

Hybrid SIMS: High End Mass Spectrometry

In recent years, the vision to image and unambiguously identify molecules on a sub-cellular level has been driving instrumental and application development. While new ion sources expanded the usability of SIMS instruments for biological applications, SIMS analysers lacked the required mass resolution, mass accuracy and MS/MS capabilities required for the thorough investigation of these materials.With the new Q ExactiveTM Extension for its existing product line IONTOF introduces the first commercial SIMS instrument which combines highest mass resolution (> 240,000) and highest mass accuracy (< 1 ppm) with high resolution cluster SIMS imaging.

Qtac: Quantitative Top Layer Atomic Characterisation by Low Energy Ion Scattering (LEIS)

The Qtac is a high sensitivity low energy ion scattering (LEIS) instrument. It is extremely surface sensitive, providing elemental and structural characterisation of the top atomic layer. This new generation instrument has been developed to include small spot analysis, surface imaging, and both static and dynamic depth profiling.

NanoScan VLS-80: High Vacuum SPM Technology

The VLS-80 is a new high vacuum scanning probe microscope developed by NanoScan in Switzerland. The VLS-80 uniquely combines high vacuum SPM performance with high precision large sample navigation. The system sets the standard in sample navigation by providing high-accuracy calibrated stage motion along with excellent positional reproducibility. High-vacuum enhances the Q-factor for outstanding measurement sensitivity. Closed-loop scanner electronics, large sample stage and a variable magnetic field option all combine to provide an instrument that defines a new state-of-the-art in scanning probe microscopy.

System Upgrades

When you buy a sophisticated and valuable analytical instrument you depend on the performance and the possibilities of the tool for many years. Not everybody has the chance to replace the entire instrument every few years to benefit from the latest developments in the field. Neverthelss, many users need to improve their analytical capacities to keep up with the demands of their industrial or academic customers.