NT-MDT Large Sample AFM | Scanwel UK

NT-MDT’s latest VEGA AFM is a cutting edge instrument designed for automated study of sample arrays. Up to 200×200 mm and 40 mm in height samples can be imaged at any point with 1 µm positioning accuracy. With built-in acoustic and vibration isolation, active temperature stabilisation, industry lowest 25 fm/√Hz optical beam deflection sensor noise and unique design of tip-scanning system, this AFM is designed for routine high resolution imaging.

Learn more about this cutting edge automated AFM at our dedicated NT-MDT page.

Summary
product image
Aggregate Rating
5 based on 1 votes
Brand Name
NT-MDT
Product Name
VEGA Large Sample Atomic Force Microscope
Price
GBP Contact us for details.
Product Availability
Available in Stock