News at Scanwel

03/02/2010
Scanwel takes over UK distributorship for NT-MDT  

NT-MDT Logo

Scanwel is pleased to announce that as of February 2010 we are able to offer NT-MDT's extensive range of ambient AFM products and accessories to customers in the UK and Ireland. Building on Scanwel's experience of 7 years in the ambient AFM industry, NT-MDT's systems come with flexibility and durability built in, and will allow us to offer a truly tailored, application-based solution to every customer. Scanwel will provide local sales and support for NT-MDT with additional local support from NT-MDT's European office which is centrally situated in Eindhoven in the Netherlands.

Product manager Rupert Smith commented: "While it is important to be able to produce high quality topography data using AFM, modern research groups demand a system which can be adapted to new requirements as experimental directions and funding streams change. Many groups also have a multi-user environment where automation and ease of use are key, and time is too valuable to spend weeks learning how an instrument works. For advanced users, it is also clear that this automation should not get in the way of the experiment. To get the most out of AFM, it is vital to be able to seamlessly integrate other techniques, in particular Raman for chemical mapping and optical microscopy for a wider view of the sample. I am excited that Scanwel is now able to offer an AFM product range which excels in all of these areas."

Highlights of the NT-MDT range include:

  • Solver NEXT for "Point and Click" AFM with fully automated laser alignment, sample positioning and integrated acoustic enclosure
  • NTEGRA Spectra: Integrated AFM with confocal microscopy and Raman spectroscopy
  • NTEGRA Therma: designed from the ground up to minimise image distortion from thermal drift
  • Tip scanning or sample scanning: NT-MDT accepts that both methods have advantages and is able to offer either or both on a single system
  • NTEGRA Tomo: The world's first AFM with integrated tomography, allowing the experimentalist to probe beyond the surface layer.

 

 

10/08/2009
SPECS launches the JT-STM for STM and AFM in the mK temperature range

 

The JT-STM marks SPECS' latest significant achievement in UHV scanning probe microscopy - simple handling, unprecedented stability, and an extremely long operating time without interruption

Click here to read more

 

30/04/2009
Scanwel now represents Nanonis for SPM control

 

Following the acquisition of Nanonis by SPECS in January 2009, Scanwel is pleased to be able to offer Nanonis products for the UK and Irish marketplace.

Click here to read more

 

 

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