Distributed Products SPeCS

Modules for  
Secondary Ion Mass Spectrometry  
and Sputtered Neutral Mass Spectrometry
  

 

Both modules (for add-on to existing instruments) and complete systems are available, for SIMS, SIMS/RGA and Thermal Desorption Analysis. Secondary Neutral Mass Spectrometry (SNMS) is available from the SSM 200 package.
   Secondary Ion Mass Spectrometer Module, SIMS 30/63

is a mass spectrometer sub-system for Secondary Ion (SIMS) and Residual Gas and Thermal Desorption Analysis. SIMS 30/63 combines high sensivity for trace analysis with an excellent dynamic range, such as is required in depth profiling experiments.

Its main features include:

  • excellent performance in both static and dynamic SIMS
  • Quadrupole mass filter with combined RGA and SIMS optics and 90° off axis multiplier
  • Molybdenum rod system
  • Rod Dia./length: 8 mm / 200 mm
  • Mass Range: 1 to 256 amu (1 to 511 amu optional)
  • Mounting flange: NW 63 CF
  • Flange to sample distance: up to 235 mm
  • bakeable up to 250°C

Main SPECS Indexonward! Complete Systemsonward!


  Secondary Neutral and Ion Mass Spectrometer Module SSM 200

is a mass spectrometer sub-system for Secondary Neutral (SNMS), Secondary Ion (SIMS) and Residual Gas and Thermal Desorption Mass Analysis. The SSM 200 enables application of all these methods available in one instrument without compromise.

SNMS analyser Its main features are:
  • high sensivity in SNMS mode by efficient electron beam postionizer configuration
  • excellent performance in both static and dynamic SIMS
  • quasimultaneous operation of all analytical modes
  • full in situ compatibility with electron spectroscopy (XPS, SSXPS, AES, SAM) in single or multiposition analysis systems
  • high dynamic range in all analytical modes by ionizer and advanced transfer optics and energy filter design
  • manual, semiautomatic and computer controlled operation of all instruments parameters
  • Mass Range: 1 to 511 amu (2 to 1023 amu optional)
  • Ionizer: Cross beam electron impact ionizer, one and two filament operation, emission current controlled (0 - 5 mA), integrated secondary ion and residual gas suppresion system
  • Ion optics: lens sytem with spherical energy filter and variable energy bandwidth, post-quadrupole focusing and deflection lens
  • Detection system: positve / negative counting CuBe multiplier handles count rates in excess of 5.000.000 cps
  • Electronics: microprocessor controlled ionizer and optics power supply with internal memory to store up to 10 parameter sets and programmable energy sweep
  • Mounting flange: DN 100 CF (optional DN 63 CF or DN 150 CF)
  • Flange to sample distance:160 mm (others on request)
  • Bakeable up to 200°C
Main SPECS Indexonward! Complete Systemsonward!